Applied Scanning Probe Methods II: Scanning Probe Microscopy by Bharat Bhushan, Harald Fuchs

By Bharat Bhushan, Harald Fuchs

Volumes II, III and IV research the actual and technical origin for fresh development in utilized near-field scanning probe concepts, and construct upon the 1st quantity released in early 2004. the sector is progressing so quick that there's a desire for a moment set of volumes to trap the newest advancements. It constitutes a well timed entire review of SPM purposes, now that business purposes span topographic and dynamical floor reviews of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. quantity II introduces scanning probe microscopy, together with sensor expertise, quantity III covers the total diversity of characterization probabilities utilizing SPM and quantity IV bargains chapters on makes use of in quite a few business purposes. The overseas viewpoint provided in those 3 volumes - which belong jointly - contributes extra to the evolution of SPM suggestions.

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Additional info for Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v. 2)

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X˙ N ⎤⎡ ⎤ ⎡ ⎤ x1 b1 ··· 0 · · · 0 ⎥ ⎢ x2 ⎥ ⎢ b2 ⎥ ⎥⎢ . ⎥ + ⎢ . ⎥u . ⎦⎣ . ⎦ ⎣ . ⎦ . . 0 0 AN xN bN 0 A2 .. 22) 1 Higher Harmonics in Dynamic Atomic Force Microscopy 11 The output matrix C describes the combination of the system states yielding the output vector with the tip displacement y1 and the deflection readout y2 . For the individual eigenmodes, the contribution to the total output is given by Cn = ϕn (ξtip ) 0 ϕn (ξsens ) 0 . 23) Here, ξtip = 1 and ξsens = 1 are the positions of the tip and the detection laser along the cantilever, respectively.

327 The Science of Beauty on a Small Scale. Nanotechnologies Applied to Cosmetic Science Gustavo Luengo, Frédéric Leroy . . . . . . . . . . 363 Part III Industrial Applications 13 14 15 16 SPM Manipulation and Modifications and Their Storage Applications Sumio Hosaka . . . . . . . . . . . . . . . 389 Super Density Optical Data Storage by Near-Field Optics Jun Tominaga . . . . . . . . . . . . . . . 429 Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM) Ryoichi Yamamoto .

For the truncated model of a free cantilever, the number of zeros n zero is determined by the number of poles n poles = 2N with n zero = n poles − 2. For the collocated actuation and sensing system, the poles and zeros alternate in the frequency response. Such a collocated configuration of tip and light lever readout is generally desirable in AFM. For an in-depth discussion of the roles of poles and zeros and the collocation of the sensor and the actuator in mechanical systems, see [69, 80, 81].

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